Abstract2018-05-24T12:52:58+00:00

Phase-field modeling of the coupled microstructure and fracture evolution in ferroelectric single crystals

Author (s): Abdollahi, A. and Arias, I.
Journal: Acta Materiala

Volume: 59, Issue 12
Pages: 4733 – 4746
Date: 2011

Abstract:
We propose a phase-field model for the coupled simulation of the microstructure formation and evolution, and the nucleation and propagation of cracks in single crystal ferroelectric ma- terials. The model naturally couples two existing energetic phase-field approaches for brittle fracture and ferroelectric domain formation and evolution. The finite element implementa- tion of the theory in two dimensions (plane polarization and plane strain) is described. We perform, to the best of our knowledge, the first crack propagation calculations of ferroelectric single crystals, allowing simultaneously for general microstructures to develop. Previously, the microstructure calculations were performed at fixed crack configuration or under the as- sumption of small scale switching. Our simulations show that this assumption breaks down as soon as the crack tip field interacts with the boundaries of the test sample (or, in general, obstacles such as defects or grain boundaries). Then, the microstructure induced by the presence of the crack propagates beyond its vicinity leading to the formation of twins. The interactions between the twins and the crack are investigated under mechanical and electro- mechanical loadings, both for permeable and impermeable cracks, with an emphasis on the fracture toughening due to domain switching, and compared with experiments.

  
  

Bibtex:

@article{2011-AM-AA,
author = "Abdollahi and Irene Arias",
title = "Phase-field modeling of the coupled microstructure and fracture evolution in ferroelectric single crystals ",
journal = "Acta Materialia ",
volume = "59",
number = "12",
pages = "4733 - 4746",
year = "2011",
issn = "1359-6454",
doi = "http://dx.doi.org/10.1016/j.actamat.2011.03.030",
url = "http://www.sciencedirect.com/science/article/pii/S1359645411001777",
}