Abstract2018-05-24T12:52:58+00:00

Adaptive analysis of yield line patterns in plates with the Arbitrary Lagrangian-Eulerian method

Author (s): Askes, H., Rodríguez-Ferran, A. and Huerta, A.
Journal: Computers and Structures

Volume: 70, Issue 3
Pages: 257 – 271
Date: 1999

Abstract:
Plasticity models provide suitable tools to describe the so-called yield line pattern that occurs with the failure of plates. However, in a Lagrangian description a huge number of finite elements is needed for accurate solutions. Accuracy can be combined with low computer costs by means of the Arbitrary Lagrangian-Eulerian (ALE) method. With the ALE method, the finite element mesh is automatically refined in the yield lines. A new remesh indicator is proposed that captures newly appearing yield lines as well as already formed yield lines. Numerical examples show the
effectiveness of this approach.

  
  

Bibtex:

@article {ARF-ARH:99,
        Author = {Harm Askes and Antonio Rodr\'{\i}guez-Ferran and Antonio Huerta},
        Title = {Adaptive analysis of yield line patterns in plates with the {A}rbitrary {L}agrangian-{E}ulerian method},
        Fjournal = {Computers \& Structures},
        Journal = {Comput. Struct.},
        Volume = {70},
        Number = {3},
        Pages = {257--271},
        Year = {1999},
	Doi = {10.1016/S0045-7949(98)00188-6}
        }